Artificial Intelligence

Powerful Test Solutions for Advancing Al and Complex Computing Applications

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Wafer Level Burn-in and Test of SiC

Leader in Silicon Carbide Wafer Level Burn-in and Test Screening

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Light

Proven Wafer Level Solution for VCSELs and Optical Communications

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3D Sensors

Burn-in and Test of Multi-Die Modules for Mobile and AR/VR

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Driver Assist

Addressing Growing Quality and Reliability Requirements for Automotive Sensors

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Leadership

40+ Years Expertise in Semiconductor Test and Burn-in

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Aehr Test Systems to acquire Incal Technology. Learn More