ABTS
The Advanced Burn-In and Test System (ABTS) solution provides flexibility for the test / burn-in of packaged semiconductor devices. The solution consists of the ABTS system that provides power, stimulus, test and thermal management. It supports common Burn-in Boards (BIBs) that hold the Devices Under Test (DUT) and a wide range of BIB Loaders for automated loading / unloading DUTs to / from BIBs.
ABTS
A high capacity system for test and burn-in of logic devices
- More DUTs per System
- Larger BIBs – up to 610 mm x 610 mm
- More BIBs – up to 72
- More iSockets* (up to 64 per BIB) *iSocket is a trademark of Sensata Technologies
- More Power – 650 W up to 1200 W per BIB
- Better Chamber
- More Power Dissipation – up to 36 KW
-
Better Airflow & Temperature Uniformity
- Narrow and Wide Chamber options
- Air and Water System Cooling options
- Small System footprint, no side access required
- More Flexibility –Better Loading, Better ROI
- Up to 36 different programs can be run in the same system at the same time
- Automotive
- Logic
- Memory
- System Level Test
- Discrete Devices & Medical
- ABTS-P
- True Per-pin Tester Architecture (timing, formatting, tristate, voltage)
- 72 BIB capacity
- 2 BIBs per program zone
- 128 independent I/O channels/BIB
- 10MHz data rate
- ABTS-Pi
- Independent device temperature control for high power devices using Sensata iSocket or VTR technology
- Up to 36KW of chamber power dissipation
- True Per-pin Tester Architecture (timing, formatting, tristate, voltage)
- Up to 36 BIB capacity
- 1 BIB per program zone
- 256 independent I/O channels/BIB
- 10MHz data rate
- ABTS-L
- Up to 72 BIB capacity
- 1 or 2 BIBs per program zone
- Up to 320 I/O channels/BIB
- 10MHz data rate
- ABTS-Li
- Independent device temperature control for high power devices using Sensata iSocket or VTR technology
- Up to 36KW of chamber power dissipation
- Up to 56 BIB capacity
- 2 BIBs per program zone
- 132 I/O channels/BIB
- 10MHz data rate
- ABTS-M
- Up to 72 BIB capacity
- Burn-in and test of all DRAM, Flash and SRAM devices
- N, N2, N3/2 algorithmic pattern generation
- Cassette handling of BIBs
Automated ABTS BIB Loader
Automated Burn-In Board (BIB) loading and unloading solution
- Multiple Burn-in Boards (BIBs) input and Output
- Trolleys Available for Transport of BIBs to/from Burn-in System and Loader/Unloader
- Device Input and Output Using JEDEC Tray Stacks (Other Types of Trays Also)
- Pass/Fail Sorting of Devices
- Very High Throughput Using Pick and Place of Multiple Devices at Once
- Fast Change-over for Different Devices
- Open Top or Lidded Device Sockets
- Very High Reliability
Burn-in Boards
Boards used to hold and connect one or more Devices Under Test (DUTs) to the power and test resources of the ABTS system
- Very Economical BIB Format
- Economical PC Fab Size
- Multiple vendors around the world
- Card-edge Connector Interface
- No Connector Cost
- Non-proprietary Interface
- No License Fees
- BIB sizes supported
- Standard: 20.67” x 22.67” (525 mm x 576 mm)
- Custom up to 24” square (610 mm square)