Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test.
Aehr Test has developed and introduced several innovative products, including the ABTS and FOX-P families of test and burn-in systems and FOX WaferPak Aligner, FOX WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP system is a full wafer contact and singulated die/module test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a custom designed reusable test board for the FOX-XP system which enables IC manufacturers to perform cost-effective test/burn-in of singulated die and modules.
LATEST FINANCIAL NEWS AND CONFERENCES
Aehr Announces Shipment of New High-Power Configured FOX-XP™ System for Wafer Level Burn-in and Stabilization of Next Generation Silicon Photonics Integrated Circuits
Aehr Receives $23 Million in New Follow-on Orders to Meet Customers’ Growing Demand for Wafer Level Test and Burn-in of Silicon Carbide Semiconductor Devices
Aehr Reports Strong Revenue and Earnings Growth for the Second Quarter and First Six Months of Fiscal 2024
Aehr Reports Continued Strong Revenue and Earnings for the First Quarter of Fiscal 2024 on Strength of Production Wafer Level Burn-in Products for Silicon Carbide Semiconductors
Aehr Test Systems to Participate in the Jefferies Semiconductor, IT Hardware & Communications Technology Summit on August 29, 2023
Aehr Test Systems to Participate in the Needham Virtual Semiconductor and SemiCap 1×1 Conference on August 22
What: Second Quarter Fiscal 2024 Financial Results
When: January 9, 2024 @ 5:00 p.m. Eastern Time (2:00 p.m. PT)
Where: Click here for the Webcast
What: William Blair 43rd Annual Growth Stock Conference
When: June 7, 2023 at 4:20 p.m. Eastern time (1:20 p.m. PT)
Where: Click here to register to listen to the presentation
Please note that this link is for informational purposes only, and is not intended for trading. Aehr Test Systems shall not be responsible for any errors, delays in content or for any actions taken in reliance thereon.
Craig-Hallum Capital Group, Christian Schwab
William Blair, Jed Dorsheimer