Aehr Test Systems, IC Burn-in of wafer level and packaged parts

Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burn-in and test of memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative…more

Test and/or Burn-in Systems for packaged parts

Test and/or Burn-in of packaged parts

The ABTS (Advanced Burn-in and Test System) is a family of innovative and highly flexible systems for the test and/or burn-in of packaged semiconductor devices (Logic, High power Logic or memory.)

  • Logic, Memory and Analog devices
  • Engineering and Production Applications
  • Multiple Chamber and Parallelism Options
  • Individual device Temperature control options

FOX-1P Massively Parallel Wafer Test


The FOX-1P system can be configured with over 16,000 “Universal Channels” and features a massively parallel test interface which enables testing over a thousand die in a single touchdown.

  • Cost-effective Solution Designed for BIST/DFT Production Test
  • Production Proven Full-Wafer Tester Solution
  • 5V “Universal” or 20V High Voltage Channels
  • Configurable Resources

Wafer and Die Contactors

Wafer and Die Contactors

The WaferPak cartridges used in FOX systems are designed for single touchdown, full wafer test and/or burn-in for massively increasing production volume. DiePak carriers are designed for burn-in and test of singulated, bare die.

  • Over 50,000 pin capability
  • Multiple contactor technology options
  • Low cost per contact