About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative…more

Test and/or Burn-in of packaged parts
 

Test and/or Burn-in of packaged parts

The ABTS (Advanced Burn-in and Test System) is a family of innovative and highly flexible systems for the test and/or burn-in of packaged semiconductor devices (Logic, High power Logic or memory.)

  • Logic, Memory and Analog devices
  • Engineering and Production Applications
  • Multiple Chamber and Parallelism Options
  • Individual device Temperature control options

Test and/or Burn-in of wafers
 

Test and/or Burn-in of wafers

The FOX-1 and FOX-15 family of full wafer contact systems provide functional test and burn-in of logic, memory, and linear/analog devices as well as process monitoring test.

  • Single and Multi-Wafer solutions
  • Single touch for wafers from 1 inch to 300mm
  • Functional Test, Burn-in, and Process Monitoring
  • Up to 12,000 power channels per wafer

Wafer and Die Contactors
 

Wafer and Die Contactors

The WaferPak cartridges used in FOX systems are designed for single touchdown, full wafer test and/or burn-in for massively increasing production volume. DiePak carriers are designed for burn-in and test of singulated, bare die.

  • Over 50,000 pin capability
  • Multiple contactor technology options.
  • Low cost per contact