Aehr Test’s systems span applications from Device Quals to High Volume Production

Wafer Level and Panel
Test and Burn-in Solutions

 
Wafer Level – Panel Test and Burn-in Solutions

FOX- 1P Test and Burn-in System

  • Single Wafer Test and Burn-in
  • Up to 16K test resources on a single wafer

PackagedPartsSolutions

FOX- XP Test and Burn-in System

  • Multi-wafer Test and Burn-in
  • Up to 18 blades per system
WafersPanel

Singulated Die and Module
Test and Burn-in Solutions

 

FOX-XP Test and Burn-in System Singulated Die/Module Test and Burn-in Solutions

  • Multi-wafer Test and Burn-in
  • Up to 9 Blades per system

DiePhotonics

Packaged Part and System-Level
Test and Burn-in Solutions

 
Packaged Part – System-Level Test and Burn-in

ABTS Test and Burn-in System

  • Burn-in/Test up to 72 Burn-in-Boards per system
  • Individual device temperature control option

PackagedPartsSolutions

FOX-XP Test and Burn-in System

  • Up to 2K test resource channels per blade
  • Up to 9 Blades per system

PackagedPartsSolutions