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Aehr Test Systems to Participate in Two Upcoming Investor Conferences

Gayn Erickson, President and CEO, and Ken Spink, CFO, to participate in annual Craig-Hallum and LD Micro investor conferences FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, and Ken…

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Aehr to Participate in the Sixth Annual NYC Investor Summit

FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, is scheduled to participate in the Sixth Annual NYC Investor Summit 2017, taking place December 6, 2017 at Le Parker Méridien Hotel in…

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Aehr to Showcase its FOX-XP™ Next Generation Test and Burn-in Systems at the 2017 International Test Conference in Fort Worth Oct 31-Nov 2

FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test at the 2017 International…

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