Fremont, CA (February 26, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it will be exhibiting in Booth 24 at the TestConX 2019 Workshop taking place March 3-6 in Mesa, Arizona at the Hilton Phoenix East/Mesa Hotel. In addition,…
Aehr Test Systems is planning to exhibit or attend the following events in 2019. Photonics West February 2-9, 2019 Booth 4046 The Moscone Center San Francisco, CA TestConX (formerly the BiTS Workshop) March 3-6, 2019 Hilton Phoenix East/Mesa Hotel Mesa, AZ IRPS March 31-April 4, 2019 Hyatt Regency…
FREMONT, Calif., Feb. 01, 2019 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it will be exhibiting in booth 4046 at the SPIE Photonics West 2019 Conference February 5 – 7 in San Francisco, CA at the Moscone Convention…
Aehr Test Systems is planning to exhibit or attend the following events in 2018. Photonics West January 27 – February 1, 2018 The Moscone Center San Francisco, CA BiTS Workshop March 4-7, 2018 Hilton Phoenix East/Mesa Hotel Mesa, AZ IRPS March 13-14, 2018 Hyatt Regency, SF Airport Burlingame, CA …
FREMONT, Calif., Oct. 29, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XPTM next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test in booth…
FREMONT, Calif., Oct. 23, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be featuring its FOX-XPTM next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test in booth…
FREMONT, Calif., Sept. 05, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it is showcasing its FOX-XP™ next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test in booth…
View or download Gayn Erickson’s Semicon West Keynote “Is there an ideal test strategy to address the safety, security, and mission critical reliability needs of tomorrow’s semiconductors and sensors?” https://www.aehr.com/wp-content/uploads/2018/07/Aehr-Semicon-2018-Keynote.pdf For more information on the Semicon West…
President & CEO Gayn Erickson to Deliver Keynote Address at Test Vision 2020 on July 11 FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and…
View or download Gayn Erickson’s BiTS 2018 Keynote “Are we proving the test coverage and reliability needed for tomorrow’s semiconductors and sensors” https://bitsworkshop.org/premium/2018/keynote/ For more information on the BiTS Workshop please visit…