Year: 2016

Aehr Test Systems to Showcase Next Generation FOX-XP™ Test and Burn-in System at the 2016 International Test Conference in Fort Worth November 15-17

FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…

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Aehr Test Systems Regains Compliance With NASDAQ Stockholders’ Equity Rule

FREMONT, Calif., Oct. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR) (the “Company”), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received notification from the NASDAQ Stock Market LLC (“NASDAQ”) that the Company has regained compliance with the minimum…

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Aehr Test Systems Reports Financial Results for First Quarter Fiscal 2017

Reports Bookings in the First Quarter of $10.4 Million FREMONT, Calif., Sept. 29, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its first quarter of fiscal 2017 ended August 31, 2016. Fiscal First Quarter…

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