Category: News

Aehr Test Systems to Showcase Next Generation FOX-XP™ Test and Burn-in System at the 2016 International Test Conference in Fort Worth November 15-17

FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…

Read more

Aehr Test Systems Regains Compliance With NASDAQ Stockholders’ Equity Rule

FREMONT, Calif., Oct. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR) (the “Company”), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received notification from the NASDAQ Stock Market LLC (“NASDAQ”) that the Company has regained compliance with the minimum…

Read more

Aehr Test Systems Reports Financial Results for First Quarter Fiscal 2017

Reports Bookings in the First Quarter of $10.4 Million FREMONT, Calif., Sept. 29, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its first quarter of fiscal 2017 ended August 31, 2016. Fiscal First Quarter…

Read more

Aehr Test Systems and Semics Inc. Announce Manufacturing and Development Partnership for FOX™ Wafer Handling and Investment by Semics in Aehr Common Stock

FREMONT, Calif. and SEONGNAM, South Korea, Aug. 24, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, and Semics Inc., a semiconductor test equipment provider that produces fully automatic wafer handling and probing systems, today announced a development…

Read more