Aehr Test Systems to Showcase Next Generation FOX-XP™ Test and Burn-in System at the 2016 International Test Conference in Fort Worth November 15-17
FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…