Category: Press Releases

Aehr Test Systems Receives Additional FOX™ Order

FREMONT, Calif., June 4, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received an order for an additional FOX-1 system to a leading flash memory manufacturer. “We are very pleased to have received this follow-on order…

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Aehr Test Systems Appoints Gayn Erickson As New CEO

FREMONT, Calif., Jan. 3, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, a 23-year veteran of the semiconductor test industry, has been appointed Chief Executive Officer (CEO) of the company, effective January 3,…

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Aehr Test Systems Receives High-Power Burn-In System Order

FREMONT, Calif., Dec. 21, 2011 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced receipt of an order in excess of $1 million for its advanced ABTSTM high power burn-in system from one of the world’s largest semiconductor manufacturers. The…

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Aehr Test Systems Ships 100th Full-Wafer Contactor

FREMONT, Calif., Dec. 7, 2011 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced the shipment of its 100th full-wafer contactor for use in its FOX™ family of products for wafer sort test and wafer level burn-in applications. “This shipment is a…

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