FREMONT, Calif., Feb. 08, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received an order from a subcontractor to its lead customer for its FOX-XP test and burn-in system products as the first step towards a high-volume…
FREMONT, Calif., Feb. 06, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received several follow-on orders for test and burn-in products from a leading multi-national manufacturer of advanced logic integrated circuits (ICs)…
FREMONT, Calif., Jan. 30, 2017 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of test and burn-in equipment for semiconductors and integrated optical devices, today announced that it will be exhibiting at the SPIE Photonics West 2017 Conference January 31 – February 2 in San Francisco, CA at the…
Aehr today announced financial results for its second quarter of fiscal 2017 ended November 30, 2016 FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its second quarter of fiscal 2017 ended November 30,…
FREMONT, Calif., Dec. 22, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will report financial results for its second quarter of fiscal 2017 ended November 30, 2016 on Thursday, January 5, 2017 following the close of the market….
5th Annual Midtown CAP Investor Summit – December 8, 2016 Download: Presentation Slides (No…
FREMONT, Calif., Dec. 02, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, will participate in the Fifth Annual Midtown CAP Investor Summit 2016 being held December 8, 2016 at Le Parker Meridien…
Craig-Hallum Alpha Select Conference – November 16, 2016 Download: Presentation Slides (No…
FREMONT, Calif., Nov. 04, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, and Ken Spink, CFO, will present at the Craig-Hallum Seventh Annual Alpha Select Conference on Wednesday, November 16, 2016…
FREMONT, Calif., Nov. 14, 2016 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP System, its next generation multi-wafer test and burn-in system for high volume production and early failure rate (EFR) test…