Aehr Test Systems Receives Follow-On Production Order For Its ABTS System From Wireless IC Manufacturer
FREMONT, Calif., March 29, 2012 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a follow-on production order for its ABTS Advanced Burn-in and Test System from a leading provider of embedded wireless technology. The system is configured for burning-in and testing advanced logic devices.
“The follow-on order shows that the burn-in and test process using the ABTS system is effective for this customer’s wireless devices for the automotive market, which requires that the ICs be qualified to operate very reliably in a harsh environment,” said Carl Buck, vice president of sales and marketing at Aehr Test Systems. “We see increasing demand not only for the standard ABTS system, but also for other members of the ABTS family that focus on high-power logic.”
The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today’s devices, but also future devices for many years to come. It is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications. It can be configured to provide individual device temperature control for devices up to 70 watts or more and it maximizes system uptime by using N+1 redundancy technology for many key components in the system.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOXTM and MAX systems and the DiePak® carrier. The ABTS system is Aehr Test’s newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company’s website at www.aehr.com.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test’s products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the ABTS technology, acceptance by customers of the ABTS systems shipped upon receipt of a purchase order and the ability of new products to meet customer needs or perform as described. See Aehr Test’s recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.
|Aehr Test Systems
EVP Sales and Marketing
(510) 623-9400 x215
|MKR Investor Relations Inc.
Todd Kehrli or Jim Byers