FREMONT, Calif., Sept. 1, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has shipped the FOX-15 Multi-Wafer Test and Burn-In System, the WaferPak Aligner and the first batch of WaferPak™ contactors for the production test and…
FREMONT, Calif., Sept. 4, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the appointment of Corporate Controller Kenneth B. Spink as Chief Financial Officer and VP of Finance, effective September 9, 2015. He will succeed Gary Larson,…
FREMONT, Calif., June 30, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has been added to the Russell Microcap index effective at the close of the market on June 26, 2015, when Russell Investments reconstituted its comprehensive set…
FREMONT, Calif., June 25, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received a $1.7 million follow-on order for its Advanced Burn-in and Test Systems (ABTS) from a leading multi-national manufacturer of advanced logic…
Accredited Investor and Publishing Research Analyst Event to be Held Concurrently With SEMICON West and Intersolar 2015 in San Francisco FREMONT, Calif., June 25, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson,…
FREMONT, Calif., June 15, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for its latest-generation ABTS-P Burn-in and Test System from a new customer, a leading mobile wireless communications chipset company in…
FREMONT, Calif., May 27, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the achievement of an important milestone in the development of its next-generation FOX-XP Wafer-Level Test and Burn-in System. The achievement of NAND flash…
FREMONT, Calif., May 7, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received over $700,000 in follow-on orders for WaferPak full-wafer contactors for its FOX-15™ multi-wafer burn-in and test system from a leading supplier of…
FREMONT, Calif., April 30, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order from a new customer in China for immediate shipment of an ABTS burn-in and test system for high temperature operating life (HTOL) testing…
FREMONT, Calif., April 27, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order from a new customer for a FOX-15 Multi-Wafer Test and Burn-In System, multiple WaferPak™ contactors and a WaferPak Aligner. The order…