Aehr Announces New Advanced Testing Capabilities on its FOX-P™ Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies
Fremont, CA (October 6, 2022) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released two new enhancements for its FOX-P family of wafer level test and burn-in systems. These include the FOX™ Bipolar Voltage Channel Module (BVCM)…