
Aehr Test Systems To Introduce Next Generation FOX-1P™ Test System At 2014 International Test Conference In Seattle October 21-23
The FOX-1P Test Cell Shown with Dual FOX-1P Systems, Dual SEMICS OPUS3 Probers and Dual FOUP Loader FREMONT, Calif., Oct. 20, 2014 (GLOBE NEWSWIRE) — Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it is introducing the FOX-1P…