4th Annual Midtown CAP Investor Summit
4th Annual Midtown CAP Investor Summit – December 10, 2015 Download: Presentation Slides (No…
Aehr Test Systems to Participate in the Fourth Annual Midtown CAP Investor Summit in New York
FREMONT, Calif., Dec. 08, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, will participate in the Fourth Annual Midtown CAP Investor Summit 2015 being held December 10, 2015 at Le Parker Meridien…
Aehr Test Systems Announces First Order for New FOX-XP™ Wafer Level Test and Burn-in System
FREMONT, Calif., Oct. 07, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the company has received its first order for its FOX-XP Wafer Level Test and Burn-in System including multiple FOX-XP WaferPak Contactors and application…
Aehr Test Systems Reports First Quarter Fiscal 2016 Financial Results
New FOX(TM) Wafer Level Test & Burn-In Application Drives Significant Sales Growth FREMONT, Calif., Sept. 24, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its first quarter of fiscal 2016 ended August 31,…
Aehr Test Systems to Announce First Quarter Fiscal 2016 Financial Results on September 24, 2015
FREMONT, Calif., Sept. 17, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will report financial results for its first quarter of fiscal 2016 ended August 31, 2015 on Thursday, September 24, 2015 following the close of the…
Aehr Test Systems Announces Shipment of FOX-15™ Multi-Wafer Burn-In System for Production Test & Burn-In Application
FREMONT, Calif., Sept. 1, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has shipped the FOX-15 Multi-Wafer Test and Burn-In System, the WaferPak Aligner and the first batch of WaferPak™ contactors for the production test and…
Aehr Test Systems Appoints Kenneth B. Spink to Chief Financial Officer
FREMONT, Calif., Sept. 4, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced the appointment of Corporate Controller Kenneth B. Spink as Chief Financial Officer and VP of Finance, effective September 9, 2015. He will succeed Gary Larson,…
CEO Summit 2015
CEO Summit – July 15, 2015 Download: Presentation Slides (No…
Aehr Test Systems Reports Financial Results for the Fourth Quarter and Fiscal Year Ended May 31, 2015
Fiscal Year-End Backlog of $12 Million Up 100% Year Over Year FREMONT, Calif., July 14, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced financial results for its fourth quarter and fiscal year ended May 31, 2015. Fiscal Fourth…
Aehr Test Systems Added to Russell Microcap Index
FREMONT, Calif., June 30, 2015 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has been added to the Russell Microcap index effective at the close of the market on June 26, 2015, when Russell Investments reconstituted its comprehensive set…