Aehr Introduces New FOX-CP™ Wafer-Level Test and Reliability Screening Solution
Fremont, CA (February 4, 2019) – Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today introduced the FOX-CP system, its new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and newest addition to its FOX-P™…