Year: 2018

BiTS 2018 Keynote

View or download Gayn Erickson’s BiTS 2018 Keynote “Are we proving the test coverage and reliability needed for tomorrow’s semiconductors and sensors” https://bitsworkshop.org/premium/2018/keynote/ For more information on the BiTS Workshop please visit…

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IRPS 2018

Aehr Test Systems will be attending IRPS 2018 at the Hyatt Regency, San Francisco Airport, Burlingame, CA on March 13-14, 2018. For more information please visit www.irps.org. IRPS March 13-14, 2018 Hyatt Regency, SF Airport Burlingame,…

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BiTS Workshop 2018

Aehr Test Systems will be attending BiTS Workshop at the Hilton Phoenix East/Mesa Hotel on March 4-7, 2018. For more information please visit…

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Aehr Announces New Customer for FOX-XP™ Test and Burn-in System

Aehr receives order for FOX-XP test and burn-in system for singulated bare die testing and burn-in of photonics devices FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial order from a new customer…

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