Aehr Test Systems to Participate in the Craig-Hallum Alpha Select Conference in New York on November 15, 2018
FREMONT, Calif., Nov. 05, 2018 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has been invited to participate in the Ninth Annual Craig-Hallum Alpha Select Conference being held on November 15, 2018 at the Sheraton Times Square Hotel in New York City.
Aehr Test President and CEO Gayn Erickson and CFO Ken Spink will hold one-on-one and small group meetings with institutional investors throughout the day.
To schedule a meeting, please contact either your Craig-Hallum representative, or the MKR Group, Aehr Test’s investor relations firm, at firstname.lastname@example.org.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has over 2,500 systems installed worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTS™ and FOX-P™ families of test and burn-in systems and FOX WaferPak™ Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP system is a full wafer contact and singulated die/module test and burn-in system used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems’ website at www.aehr.com.
|Aehr Test Systems
V.P of Marketing
(510) 623-9400 x381
|MKR Group Inc.
Todd Kehrli or Jim Byers