Year: 2017

Aehr to Participate in the Sixth Annual NYC Investor Summit

FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that Gayn Erickson, President and CEO, is scheduled to participate in the Sixth Annual NYC Investor Summit 2017, taking place December 6, 2017 at Le Parker Méridien Hotel in…

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Aehr to Showcase its FOX-XP™ Next Generation Test and Burn-in Systems at the 2017 International Test Conference in Fort Worth Oct 31-Nov 2

FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it will be showcasing its FOX-XP next generation multi-wafer test and burn-in systems for high volume production and early failure rate (EFR) test at the 2017 International…

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Aehr Receives Follow-on Orders for FOX-XP™ Test and Burn-in Solution

FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR) , a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has received follow-on orders totaling $2.7 million from a subcontractor of its initial lead FOX-XPTM Test and Burn-in System customer. The orders include a partially…

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