Aehr to Exhibit at the International Reliability Physics Symposium March 11-15, 2018
Aehr today announced that it will exhibit at the International Reliability Physics Symposium (IRPS) taking…
Aehr to Exhibit at Burn-in and Test Strategies Workshop in Mesa, AZ March 4-7, 2018; CEO Gayn Erickson to Present Keynote Address
Aehr will exhibit and Gayn Erickson will deliver the keynote address at the Burn-in and Test Strategies…
Aehr Receives New Customer Order for ABTS™ Burn-in and Test System for Military and Aerospace Application
Aehr has received a new ABTS order from a prominent United States government military and aerospace…
Aehr Receives Orders Exceeding $2.5 Million for Burn-in and Test Products for Automotive Semiconductor Devices
Aehr received orders for products and services from leading manufacturer of advanced logic ICs for automotive…
Aehr Announces New Customer for FOX-XP™ Test and Burn-in System
Aehr receives order for FOX-XP test and burn-in system for singulated bare die testing and burn-in of…
Aehr Receives Follow-on Order for FOX-XP™ Test and Burn-in System for Silicon Photonics Devices
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
Aehr to Participate in the Sixth Annual NYC Investor Summit
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
Aehr to Participate at the Craig-Hallum Alpha Select Conference in New York on November 16, 2017
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
Aehr Announces Order for ABTS-Pi™ Burn-in and Test System from new Semiconductor Manufacturing Customer in China
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
Aehr to Showcase its FOX-XP™ Next Generation Test and Burn-in Systems at the 2017 International Test Conference in Fort Worth Oct 31-Nov 2
FREMONT, Calif., (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor…
