
Aehr Test Systems Reports 56% Revenue Growth for Fiscal Year 2018 and Provides Financial Guidance for Fiscal 2019
Aehr announces fourth quarter and full year financial results for FY 2018 FREMONT, Calif., (GLOBE…

Aehr Test Systems to Participate in 10th Annual CEO Investor Summit 2018 in San Francisco July 11
Accredited Investor and Publishing Research Analyst Event to be Held Concurrently with SEMICON West and…

Aehr Test Systems to Exhibit at the Semiconductor Wafer Test Workshop June 3-6, 2018 in San Diego CA
Will showcase FOX-XPTM solutions for wafer-level burn-in and test of logic, optical and memory devices …

Aehr Test Systems to Participate in Two Upcoming Investor Conferences
Gayn Erickson, President and CEO, and Ken Spink, CFO, to participate in annual Craig-Hallum and LD Micro…

Aehr Announces Follow-on Order for Multiple ABTS™ Burn-in and Test Systems From Wireless Chipset Manufacturer
Aehr receives $1.5 million order from wireless communications chipset company for automotive device test and…

Aehr to Exhibit at the International Reliability Physics Symposium March 11-15, 2018
Aehr today announced that it will exhibit at the International Reliability Physics Symposium (IRPS) taking…

Aehr to Exhibit at Burn-in and Test Strategies Workshop in Mesa, AZ March 4-7, 2018; CEO Gayn Erickson to Present Keynote Address
Aehr will exhibit and Gayn Erickson will deliver the keynote address at the Burn-in and Test Strategies…

Aehr Receives New Customer Order for ABTS™ Burn-in and Test System for Military and Aerospace Application
Aehr has received a new ABTS order from a prominent United States government military and aerospace…

Aehr Receives Orders Exceeding $2.5 Million for Burn-in and Test Products for Automotive Semiconductor Devices
Aehr received orders for products and services from leading manufacturer of advanced logic ICs for automotive…

Aehr Announces New Customer for FOX-XP™ Test and Burn-in System
Aehr receives order for FOX-XP test and burn-in system for singulated bare die testing and burn-in of…