Press Releases Archive

• (October 23, 2007) - Aehr Test Systems Announces FOX-15™ Full Wafer Contact Test And Burn-in System
• (September 25, 2007) - Aehr Test Systems Reports First Quarter Fiscal 2008 Results
• (September 25, 2007) - Aehr Test Systems Receives Follow-on FOX™-1 Order From A Major IC Manufacturer
• (July 24, 2007) - Aehr Test Systems Reports Fourth Quarter And Fiscal 2007 Results
• (July 9, 2007) - Aehr Test Systems Appoints Joel Bustos As Vice President Of Operations
• (March 27, 2007) - Aehr Test Systems Reports Third Quarter Results For Fiscal 2007
• (March 27, 2007) - Aehr Test Systems Receives Follow-on FOX™-1 Orders From A Major IC Manufacturer
• (March 27, 2007) - Aehr Test Systems Receives MTX Order From A Leading Memory Module Manufacturer
• (January 4, 2007) - Aehr Test Systems Reports Second Quarter Results For Fiscal 2007
• (January 4, 2007) - Aehr Test Systems Receives Follow-On FOX™-1 Orders From A Major IC Manufacturer
• (September 26, 2006) - Aehr Test Systems Reports First Quarter Results For Fiscal 2007
• (September 26, 2006) - Aehr Test Systems Receives FOX™-1 Orders From A Leading IC Manufacturer
• (September 22, 2006) - Aehr Test Systems Ships First FOX™-1 System
• (July 19, 2006) - Aehr Test Systems Reports Fourth Quarter And Fiscal Year 2006 Results
• (June 20, 2006) - Aehr Test Systems Completes Final FOX™-1 Milestone
• (March 23, 2006) - Aehr Test Systems Reports Third Quarter Results For Fiscal 2006
• (March 14, 2006) - Aehr Test Systems Receives Multi-Million Dollar FOX™ Wafer-Level Burn-in Order
• (February 28, 2006) - Aehr Test Systems Receives Multi-Million Dollar Repeat Orders for MAX Burn-in and Test Systems
• (January 5, 2006) - Aehr Test Systems Reports Second Quarter Results For Fiscal 2006
• (September 27, 2005) - Aehr Test Systems Reports First Quarter Results For Fiscal 2006
• (September 1, 2005) - Aehr Test Systems Receives Follow-On MAX Orders From Major IC Manufacturer
• (August 23, 2005) - Aehr Test Systems Receives Follow-On MTX Orders From Major Memory Manufacturer
• (July 19, 2005) - Aehr Test Systems Reports Fourth Quarter and Fiscal 2005 Results
• (June 6, 2005) - Aehr Test Systems Announces FOX™-1 Full Wafer Test System
• (April 27, 2005) - Aehr Test Systems Receives Production Order For FOX™ Full Wafer Test System
• (March 24, 2005) - Aehr Test Systems Reports Third Quarter Results For Fiscal 2005
• (January 6, 2005) - Aehr Test Systems Receives MTX Order From Viking Interworks
• (January 6, 2005) - Aehr Test Systems Reports Second Quarter Results For Fiscal 2005
• (September 21, 2004) - Aehr Test Systems Reports First Quarter Results for Fiscal 2005
• (July 20, 2004) - Aehr Test Systems Reports Fourth Quarter and Fiscal 2004 Results
• (June 8, 2004) - Aehr Test Systems Appoints Gregory Perkins as Vice President of Worldwide Sales and Service
• (May 3, 2004) - Aehr Test Systems Receives Follow-on MTX Orders From Memory Manufacturer
• (Mar. 25, 2004) - Aehr Test Systems Reports Third Quarter Results For Fiscal 2004
• (Mar. 25, 2004) - Aehr Test Systems Delivers FOX™ Full Wafer Test & Burn-in System
• (Mar. 25, 2004) - Aehr Test Systems Receives MTX Order From Memory Manufacturer
• (Jan. 7, 2004) - Aehr Test Systems Reports Second Quarter Results for Fiscal 2004
• (Dec. 18, 2003) - Aehr Test Systems to Sell Portion of Ownership in Singapore's ESA Electronics
• (Sep. 24, 2003) - Aehr Test Systems Reports First Quarter Results for Fiscal 2004
• (Sep. 23, 2003) - Aehr Test Systems Receives Order for FOX™ Full Wafer Test & Burn-In System
• (Jul. 28, 2003) - Aehr Test Systems Receives Additional Wafer-Level Patents
• (Jul. 22, 2003) - Aehr Test Systems Reports Fourth Quarter and Fiscal 2003 Results
• (Jul. 22, 2003) - Aehr Test Systems Announces New Massively Parallel Test & Burn-In System
• (Mar. 25, 2003) - Aehr Test Systems Reports Third Quarter Results for Fiscal 2003
• (Mar. 19, 2003) - Aehr Test Systems Receives Order for FOX™ Full Wafer Test and Burn-in System
• (Feb. 13, 2003) - Aehr Test Systems Receives MTX Order From Nanya's Test and Assembly Subcontractors
• (Feb. 13, 2003) - Aehr Test Systems Receives MTX Order From Nanya's Test and Assembly Subcontractors
• (Jan. 8, 2003) - Aehr Test Systems Reports Second Quarter Results for Fiscal 2003
• (Sep. 25, 2002) - Aehr Test Systems Reports First Quarter Results For Fiscal 2003
• (Jul. 23, 2002) - Aehr Test Systems Reports Fourth Quarter Results For Fiscal 2002
• (Jul. 18, 2002) - Aehr Test Systems Names New U.S. Representative for DiePak Sales
• (Jul. 17, 2002) - Aehr Test Systems Announces Qualification of Wafer-Level Burn-in System for VCSELs
• (Jul. 16, 2002) - Aehr Test Systems to Celebrate Silver Anniversary as it Exhibits at Semicon West
• (Jun. 19, 2002) - Aehr Test Systems Announces Development Order for 300mm Full Wafer Contact Tester
• (Jun. 10, 2002) - Aehr Test Systems to be Represented in China by ZMC Technologies
• (Mar. 21, 2002) - Aehr Test Systems Reports Third Quarter Results For Fiscal 2002
• (Jan. 8, 2002) - Aehr Test Systems Reports Second Quarter Results For Fiscal 2002
• (Oct. 12, 2001) - Aehr Test Systems and Pycon Form Partnership to Provide Low Cost "Plug and Play" Burn-in Boards
• (Sep. 25, 2001) - Aehr Test Systems Reports First Quarter Results For Fiscal 2002
• (Sep. 25, 2001) - Aehr Test Systems Announces Max4 Systems Sale to ASE Test
• (Jul 19, 2001) - Aehr Test Systems Reports Fourth Quarter and Fiscal 2001 Results
• (Jul. 16, 2001) - Aehr Test Systems Introduces New High-Power MAX3 Monitored Burn-in System With JTAG Testing Capabilities
• (Jul. 12, 2001) - Aehr Test Systems Introduces Full Wafer Contact Burn-in and Parallel Test System
• (Jun. 7, 2001) - Aehr Test Systems Receives First Wafer-Level Burn-In Order
• (May 15, 2001) - Aehr Test Systems Opens Office in Taiwan
• (Mar. 19, 2001) - Aehr Test Systems Reports Third Quarter Results for Fiscal 2001
• (Mar. 5, 2001) - Aehr Test Systems Adopts Shareholder Rights Plan
• (Jan. 3, 2001) - Aehr Test Systems Reports Second Quarter Results for Fiscal 2001
• (Jan. 3, 2001) - Aehr Test Systems Completes DARPA Agreement on Wafer-Level Burn-in and Test System
• (Nov. 7, 2000) - Aehr Test Systems Elects Robert R. Anderson to Board of Directors
• (Oct. 25, 2000) - Aehr Test Systems Receives ISO 9001 Certification
• (Oct. 20, 2000) - Aehr Test Systems Appoints David Hendrickson as Vice President of Engineering
• (Sep. 21, 2000) - Aehr Test Systems Receives a $2.3 Million Order from Dallas Semiconductor
• (Aug. 31, 2000) - Aehr Test Systems Receives More Than $2.7 Million in MTX Orders >From Taiwanese Manufacturers
• (Jul. 20, 2000) - Aehr Test Wins Parallel Memory Tester Order From TSMC
• (Jul. 7, 2000) - Aehr Test Introduces NEW MAX3 Monitored Burn-in System with JTAG Testing Capabilities
• (Jun. 1, 2000) - C.J. Meurell Named President and COO of Aehr Test Systems
• (Apr. 27, 2000) - Aehr Test and Chip Supply Team to Provide Test and Burn-in services for Known Good Die
• (Feb. 15, 2000) - Aehr Test Receives Second U.S. Patent for DiePak® Carrier
• (Dec. 16, 1999) - Aehr Test Receives $1 Million in DiePak Carrier Orders
• (Sep. 24, 1999) - Aehr Test Receives MTX Orders Valued at $10 Million from Three Taiwanese Manufacturers
• (Jul. 12, 1999 ) - Aehr Test Systems Announces Integrated Rambus Memory Testing Solution
• (Jul. 12, 1999) - Aehr Test Systems and Electroglas Announce Development Agreement for Complete Wafer-Level Burn-in and Test Solution
• (Jul. 9, 1999) - Aehr Test Systems and NHK Spring Announce Development Agreement for Full-Wafer probe Contactors for Wafer-Level Burn-in System
• (Dec. 2, 1998) - Aehr Test Systems Announces Roll-out of New MAX3 Dynamic Burn-in System
• (Dec. 2, 1998) - Aehr Test Systems Introduces the New ATX2 Monitored Burn-in System
• (Jan. 5, 1998) - Aehr Test Systems Receives ISO 9001 Certification