Latest NewsAehr Test Systems Appoints David Hendrickson as Vice President of Engineering
Fremont, CA October 20, 2000 — Aehr Test Systems (Nasdaq: AEHR), a leading provider of systems for burning-in and testing DRAMs and other integrated circuits, today announced that David Hendrickson has been appointed Vice President of Engineering.
With more than 15 years of engineering management experience, Hendrickson will be responsible for leading Aehr Test’s new product development efforts focusing on products which decrease our customers’ overall cost of test and burn-in. Examples of such products are Aehr Test’s MTX parallel memory test systems, recently sold to major Taiwanese manufacturers including Taiwan Semiconductor Manufacturing Corporation (TSMC), and our MAX and ATX burn-in and test systems, with recently announced sales to Dallas Semiconductor.
Significantly, Hendrickson will also be spearheading Aehr Test’s development of a wafer-level test and burn-in system. The wafer-level test and burn-in system is engineered to enable integrated circuit manufacturers to achieve significant cost savings by performing burn-in and parallel functional test of integrated circuits while still in wafer form.
Prior to joining Aehr Test, Hendrickson spent five years at Acuson Medical, most recently as Platform General Manager, and five years as Director of Engineering at Automatic Test Equipment (ATE) manufacturer Megatest Corporation. At Megatest (now part of Teradyne Inc.), Hendrickson managed hardware and software development for next generation ATE products and improved the time to market significantly over previous generation developments. Hendrickson holds a BS degree in Computer Science from Illinois Institute of Technology.
“We are very excited to bring Dave’s proven record of leadership and results in the semiconductor capital equipment industry, particularly ATE, to Aehr Test,” said C.J. Meurell, President and Chief Operating Officer. “Dave’s appointment will further strengthen the development of our product families, particularly the wafer-level burn-in system, underscoring the high priority we have placed on delivering high-quality products to our customers.”
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of systems for burning-in and testing DRAMs and other integrated circuits and has an installed base of more than 2,000 systems worldwide. Aehr Test has developed and introduced two innovative product families, the MTX system and DiePak® carrier. The MTX is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die.Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company's products. Actual results may vary from projected results. These risks and uncertainties include economic conditions in Asia and elsewhere, increased acceptance by customers of the MTX, MAX and DiePak technologies, and the potential emergence of alternative technologies, which could adversely affect demand for the Company's products. See the Company's 10-K and most recent 10-Q filed with the SEC for additional risks affecting the Company.