Latest NewsAehr Test Systems Receives a $2.3 Million Order from Dallas Semiconductor
FREMONT, CA September 21, 2000 – Aehr Test Systems (Nasdaq: AEHR), a leading supplier of test and burn-in equipment to semiconductor manufacturers, announced today the receipt of an initial multi-system order totaling $2.3 million from Dallas Semiconductor Corp. (NYSE:DS). The order includes both MAX3 and ATX2 burn-in and test systems to be used for production and QA monitoring and burn-in of a broad line of mixed signal devices addressing markets such as broadband telecommunications, wireless handsets, network computing and power management for portable computers.
The MAX3 offers extended capabilities to test low voltage and high current devices with complex test patterns. With up to 96 signal channels and 10MHz operating frequency, the MAX3 is well-suited to the burn-in and test challenges created by the requirements of the new devices designed for wireless and portable applications. The ATX2 augments the MAX3 capabilities by providing up to 256 signal pins for high pin count ICs such as the control devices for gigabit Ethernet and fiber channel applications.
“We believe that Dallas Semiconductor selected the MAX3 and the ATX2 systems for their advanced burn-in and test capabilities, and for their software compatibility, similar operation and burn-in program portability,” said C.J. Meurell, president and chief operating officer of Aehr Test Systems. “Aehr Test focuses on having extensive support coverage around the world and on keeping a technological leadership position in the burn-in industry to satisfy global customers like Dallas Semiconductor.”
The popular MAX3 Dynamic Burn-in System gives semiconductor manufacturers the ability to cost-effectively burn-in and functionally test newly emerging devices such as digital signal processors (DSPs), microprocessors, microcontrollers, flash memories and systems-on-a-chip.
“We designed the MAX3 with functional test features to take advantage of JTAG and built-in self test (BIST) for testing today’s leading devices,” said Carl Buck, vice president of marketing. This allows IC manufacturers who use BIST to take advantage of self test in burn-in. JTAG is an industry standard testing protocol that allows devices to be tested by using as few as four pins to load a long stream of vectors into the device.
The ATX2 system’s flexibility was designed to provide an economic burn-in solution for high pin-count integrated circuits such as microprocessors and systems-on-a-chip. This system’s 256 unique input/output channels and deep vector memory allow the burn-in of complex logic devices.
“The ATX2’s flexible architecture enables customers to burn-in many different types of integrated circuits in a single run,” concluded Buck.
About Aehr Test Systems
Aehr Test Systems, headquartered in Fremont, California, has been a leading provider of semiconductor burn-in and test equipment since 1977 and has shipped more than 2,000 systems worldwide. Aehr Test developed and introduced two innovative product families, the MTX-R system and the DiePak? carrier. The MTX-R system is a massively parallel test system capable of processing thousands of memory devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die for the Known Good Die market.Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company’s products. Actual results may vary from projected results. These risks and uncertainties include economic conditions in Asia and elsewhere, acceptance by customers of the MTX, MAX and DiePak technologies, and the potential emergence of alternative technologies, which could adversely affect demand for the Company’s products in fiscal 2001. See the Company’s 10-K filed with the SEC for additional risks affecting the Company.