Latest NewsAehr Test Systems Receives More Than $2.7 Million in MTX Orders From Taiwanese Manufacturers
FREMONT, CA., August 31, 2000 - Aehr Test Systems (Nasdaq: AEHR - news) announced today that it has received follow-on orders valued at more than $2.7 million from NANYA Technology Corporation's Taiwanese assembly and test sub-contractors for Aehr Test's MTX-R massively parallel test products. The MTX-R system's parallel test and burn-in capabilities will be used to increase test capacity for 64M SDRAM and to qualify new capacity for 256M DDR DRAMS.
``The customers have told us that the MTX-R is being used on their production floor because of its demonstrated high performance in testing the next generation of DDR devices,'' said CJ Meurell, President and Chief Operating Officer of Aehr Test Systems. ``This added capacity could reduce the number of very expensive test systems otherwise required for final test.''
``The MTX-R memory testing solution performs the functional tests of a monitored burn-in system and a large part of the traditional patterns to be off-loaded from the final tester,'' said Carl Buck, VP of Marketing. ``Using an ATE Class pattern generator, the MTX-R memory test system has been engineered to satisfy the programming requirements of a wide variety of functional tests with high accuracy.'' The MTX-R's powerful pattern generator, dual level compare and flexible timing system allow manufacturers to use the system to test most memory devices currently in production, including SRAM, SDRAM, RDRAM, DDR SDRAM, and DRAM.
The MTX Massively Parallel Test System has correlated extremely well with the test results of high-speed testers. This allows manufacturers to offload up to 70% of the test time traditionally performed on high-speed testers and more cost-effectively test semiconductor memories. High-speed testers then need only be used for the parametric tests and high-speed sorting that require their costly high performance features.
``By incorporating the MTX-R into the memory device test process, I believe manufacturers can substantially reduce their equipment expenditures at production levels,'' noted Rhea Posedel, Chief Executive Officer of Aehr Test Systems. ``This can lead to significant reductions in the cost of memory device production.''
About Aehr Test
Aehr Test Systems, headquartered in Fremont, California, has been a leading provider of systems for burning-in and testing DRAMs and other integrated circuits since 1977, and has shipped over 2,000 systems worldwide. Aehr Test has developed and introduced two new innovative product families, the MTX system and DiePak® carrier. The MTX is a massively parallel test system capable of processing thousands of memory devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die for the Known-Good-Die (KGD) market.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding timing of new product introduction and customer acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include technological risks in design and development and the potential emergence of alternative technologies which could adversely affect demand for Aehr Test's products. See Aehr Test's 10-K filed with the SEC for additional risks affecting the Company.