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C.J. MEURELL NAMED PRESIDENT AND COO OF AEHR TEST SYSTEMS

Fremont, CA June 1, 2000 — Aehr Test Systems (Nasdaq: AEHR), a leading provider of systems for burning-in and testing DRAMs and other integrated circuits, today announced that Vice President of Worldwide Sales and Service C.J. Meurell has been promoted to the position of President and Chief Operating Officer (COO). In his new role, Meurell will assume responsibility for Aehr Test’s day-to-day operations. Former President Rhea Posedel will remain in the positions of chairman and CEO, from which he will focus on driving the Company’s leading technology and its future strategic direction.

“This transition comes at an auspicious time for Aehr Test Systems. We have reached the point where strategic planning for the future of the Company and its technology, and the day-to-day execution of that plan, are both full-time jobs,” said Posedel. “C.J. has played a key role in strengthening our customer relationships, building our global customer service and support organization, and helping drive the Company’s strategic programs. His wealth of knowledge in all aspects of our industry, and vast expertise in international customer operations, sales and marketing will insure that our commitment to providing excellence to our customers will continue to be an integral part of our day-to-day business.”

Meurell has served as Vice President, Worldwide Sales and Service, and General Manager of Aehr Test’s ATf  business unit since March 1999. From June 1996 to March 1999, Meurell was Vice President and General Manager for flat panel capital equipment manufacturer Photon Dynamics. For 13 years he served in various senior level positions at Megatest Corporation, a semiconductor test equipment manufacturer. Meurell has a master’s degree in business administration from Union College, NY, and a Bachelor of Science degree in electrical engineering, magna cum laude, from the University of Massachusetts, Dartmouth.
 

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading provider of systems for burning-in and testing DRAMs and other integrated circuits and has an installed base of more than 2,000 systems worldwide.  Aehr Test has developed and introduced two innovative product families, the MTX system and DiePak® carrier. The MTX is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die.

This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company's products. Actual results may vary from projected results. These risks and uncertainties include economic conditions in Asia and elsewhere, increased acceptance by customers of the MTX and DiePak technologies, and the potential emergence of alternative technologies, which could adversely affect demand for the Company's products. See the Company's 10-K and most recent 10-Q filed with the SEC for additional risks affecting the Company.