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Aehr Test Receives MTX Orders Valued at $10 Million from Three Taiwanese Manufacturers

Mountain View, CA (September 24, 1999) - Aehr Test Systems (NASDAQ:AEHR) announced today it has received orders valued at approximately $10 million from three Taiwanese companies for Aehr Test's MTX Massively Parallel Test products. The MTX systems will be used in production parallel test and burn-in of DRAMs.

"We believe that our MTX system was chosen because it is the best solution for these manufacturers' current and future testing and burn-in needs," stated Rhea Posedel president and CEO of Aehr Test Systems. "The MTX system has the ability to fully functionally test thousands of devices at a time. It was designed to accommodate future generations of memories including Rambus DRAMs and Double Data Rate DRAMs.

"The MTX memory testing solution performs the time-consuming functional tests of the traditional tester, off-loading up to 70 percent of the test time from the final tester," added Mr. Posedel. "As a result, we believe the MTX is one of the industry's most cost-effective solutions, testing over 10,000 Rambus DRAMs in one system and providing traditional burn-in as well.

"This capability allows semiconductor manufacturers to use their higher-cost testers for the high-speed and high-accuracy tests for which they are best suited. The MTX is able to test during burn-in, which enables manufacturers to detect intermittent failures that only occur during burn-in and would otherwise pass during a traditional final test.

"Our systems provide high-throughput, accurate results that enable manufacturers to lower their overall cost of production while improving IC yield," concluded Mr. Posedel.

About Aehr Test Systems
Headquartered in Mountain View, California, Aehr Test Systems is a leading provider of systems for burning-in and testing DRAMs and other integrated circuits and has an installed base of more than 2,000 systems worldwide. Aehr Test has developed and introduced two innovative product families, the MTX system and DiePak® carrier. The MTX is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die.

The information contained in this release does not change the Company's previous statements that it expects lower gross margins in the first quarter of fiscal 2000 than in the quarter ended May 31, 1999, and that it expects to record a net loss in the first quarter. This release contains forward-looking statements that involve risks and uncertainties including projections regarding timing of new product introduction and customer acceptance for Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include technological risks in design and development and the potential emergence of alternative technologies, which could adversely affect demand for Aehr Test's products. See Aehr Test's 10-K filed with the SEC for additional risks affecting the Company.