Latest NewsAehr Test Systems Announces Roll-out of New MAX3 Dynamic Burn-in System
New System Designed to Burn-in Digital Signal Processors and Other Emerging Low-voltage Devices
TOKYO, December 2, 1998 (SEMICON Japan 98, Hall 11, B-501) - Aehr Test Systems (Nasdaq: AEHR), a leading supplier of test and burn-in equipment to semiconductor manufacturers, today announced the commercial roll-out of its new MAX3 Dynamic Burn-in System. The system provides semiconductor manufacturers with the ability to cost-effectively burn-in newly-emerging devices such as digital signal processors (DSPs), Rambus DRAMs and systems-on-a-chip as well as other integrated circuits and supporting devices that operate at today's lower voltages.
"The DSP, Rambus DRAM and low-voltage device markets are expected to be the strongest long-term growth drivers in the semiconductor industry," said Rhea Posedel, president and chief executive officer. "We designed the MAX3 to address the needs of these and other advanced integrated circuit markets while at the same time perform at the high level that has made our ATS-12000 and MAX family of burn-in products the industry standard for 20 years."
The MAX3 Dynamic Burn-in System features burn-in voltages as low as 0.7 v DC, providing a single burn-in solution for integrated circuits with line widths down to 0.18 microns and smaller. The system also features 96 input/output channels - double the number offered by most burn-in systems on the market today - which allows a more complete exercise of higher pin-count devices and the manufacture of more reliable integrated circuits. The MAX3 utilizes Windows NTä - the powerful and widely-used operating system that is both easy to use and able to support a large network of MAX3 systems.
Additional features of the MAX3 include:
Aehr Test Systems has been a leading provider of semiconductor burn-in and test equipment since 1977 and has shipped more than 2,000 systems world-wide. Aehr Test recently developed and introduced two new innovative product families, the MTX system and the DiePakâ carrier. The MTX system is a massively parallel test system capable of processing thousands of memory devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die for the Known Good Die market.
- Memory patterns for both standard and embedded memory
- Vector patterns for logic
- Re-configurable vector memory to 24 Mb deep for boundary scan applications
- High-current capabilities for new highly-integrated devices
- Analog and digital signal generation
- Backwards compatible with MAX2, MAX-64000 and ATS-12000 burn-in boards
- Three separate power supplies
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company's products. Actual results may vary from projected results. These risks and uncertainties include economic conditions in Asia and elsewhere and the potential emergence of alternative technologies which could adversely affect demand for the Company's products in fiscal 1999. See the Company's 10-K filed with the SEC for additional risks affecting the Company.
For more information on AEHR TEST SYSTEMS via fax at no cost, dial (800) PRO-INFO (908-544-2850 outside the U.S.), ticker symbol AEHR.
Note: Windows NT is a trademark Microsoft Corporation