Latest NewsAehr Test Systems introduces the new ATX2 Monitored Burn-in System
Latest Innovation in the ATX Family of Monitored Burn-in Systems
TOKYO, December 2, 1998 (SEMICON Japan 98, Hall 11, B-501) -- Aehr Test Systems (Nasdaq: AEHR), a leading supplier of test and burn-in equipment to semiconductor manufacturers, today announced it has launched the new ATX2 Monitored Burn-in System, a flexible burn-in system designed to meet the technological requirements of high pin-count integrated circuits.
"The ATX2's tremendous flexibility provides our customers with a cost-effective burn-in solution for high pin-count integrated circuits such as microprocessors and systems-on-a-chip," said Rhea Posedel, president and chief executive officer of Aehr Test Systems. "The system's 256 unique input/output channels and deep vector memory allow it to burn-in complex logic devices. Additionally, the system's flexible architecture enables the burning-in of many different types of integrated circuits in a single run. Its addition to our product line enhances our ability to provide burn-in solutions for today's and tomorrow's semiconductors."
The ATX2 is the latest addition to Aehr Test's ATX family of monitored burn-in systems. It is designed with the same core features of the original ATX-32000 model including advanced pattern generation and 32 independent electrical zones, which allow the simultaneous burn-in of multiple device types.
The new ATX2 also boasts reconfigurable vector memory that allows 2 Mb deep pattern generation for normal 256 channel operation or 24 Mb deep for 4 channel boundary scan applications. It also features a low-voltage power module that allows the burn-in of devices with voltages as low as 1.0 VDC. This enables the system to be used to burn-in integrated circuits with line widths even smaller than today's state-of-the-art 0.18 microns.
The ATX2's output monitoring capability allows the continuous monitoring of the outputs of the devices being burned-in, verifying both that the devices are functioning properly and that they are receiving the correct stress patterns.
The ATX2 features the Windows NT™ operating system. Windows NT provides an easy to use interface and and powerful networking capabilities. The ATX2 also uses the Microsoft SQL Database, standard Ethernet networking and TCP/IP protocols. The system is also backwards compatible with ATX-32000 burn-in boards.
The ATX2 has been tested to the Sematech Year 2000 Readiness Test and qualifies as Year 2000 Ready. Existing ATX-32000 customers can upgrade to ATX2 capabilities easily, both solving the Year 2000 problem and acquiring the new features of the ATX2.
Aehr Test Systems, headquartered in Mountain View, California, has been a leading provider of systems for burning-in and testing DRAMs and other integrated circuits since 1977, and has shipped over 2,000 systems worldwide. Aehr Test has developed and introduced two new innovative product families, the MTX system and DiePak® carrier. The MTX is a massively parallel test system capable of processing thousands of memory devices simultaneously. The DiePak carrier is a reusable, temporary package that enables integrated circuit manufacturers to perform cost-effective final test and burn-in of bare die.
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding industry growth and customer demand for the Company's products. Actual results may vary from projected results. These risks and uncertainties include economic conditions in Asia and elsewhere and the potential emergence of alternative technologies which could adversely affect demand for the Company's products in fiscal 1999. See the Company's 10-K filed with the SEC for additional risks affecting the Company.
For more information on AEHR TEST SYSTEMS via fax at no cost, dial (800) PRO-INFO (908-544-2850 outside the U.S.), ticker symbol AEHR.
Note: Windows NT is a trademark of Microsoft Corporation